-
[1]
. Enlow R N, Pease R L, Combs W E. IEEE Trans. Nucl.Sci., 1991, 38(6): 13422. Johnston A H, Lee C I, Rax B G. IEEE Trans. Nucl. Sci.,1996, 43(6): 30493. Johnston A H, Swift G M, Rax B G. IEEE Trans. Nucl.Sci., 1994, 41(6): 24274. Titus J L, Emily D, Krieg J F et al. IEEE Trans. Nucl.Sci., 1999, 46(6): 16085. Rashkeev S N, Cirba C R, Fleetwood D M.IEEE Trans.Nucl. Sci., 2002, 49(6): 26506. Fleetwood D M. Microelectronics Reliability, 2002, 42μ5237. Hjalmarson H P, Pease R L et al. IEEE Trans. Nucl. Sci.,2003, 50(6): 19018. Fleetwood D M, Wu A et al. IEEE Trans. Nucl. Sci., 1996,43(6): 3032