电光采样(EOS)法测量超短电子束束团长度中的模拟计算与误差分析

[1]
. YAN X, MacLeod A M, Gillespie W A et al. Phys. Rev. Lett., 2000, 85(16) : 3404-34072. Berden G, Knippels G M H, Oepts D et al. Proc. DIPAC., 2003, IT05: 20-243. Wilke I, MacLeod A M, Gillespie W A et al. Phys. Rev. Lett., 2002, 88(12): 124801-1-124801-44. Berden G, Redlich B, van der Meer A F G. Proc. FEL. 2004, 343-3465. Yariv A. Optical Electronics in Modern Communications. Oxford University Press, 1997. 17-386. SUN Da-Rui et al. Measurement of Relativistic Electron Beam Bunch Bength by Electro-Optic Sampling Method. HPL PB, to be published(in Chinese)(孙大睿等. 用电光采样法测量相对论电子束团长度. 强激光与粒子束, 待发表)