Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

Get Citation
LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202. doi: 10.1088/1674-1137/37/1/018202
LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202.  doi: 10.1088/1674-1137/37/1/018202 shu
Milestone
Received: 2012-03-02
Revised: 2012-08-16
Article Metric

Article Views(1825)
PDF Downloads(378)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

    Corresponding author: TUO Xian-Guo,

Abstract: A semi-empirical detector response function (DRF) model of Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements' characteristic X-ray spectra are obtained by Si (PIN) detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.

    HTML

Reference (1)

目录

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return