Experimental study using Touschek lifetime as machine status flag in SSRF

CHEN Zhi-Chu; LENG Yong-Bin; YUAN Ren-Xian; YAN Ying-Bing; YU Lu-Yang

doi:10.1088/1674-1137/38/7/077005

Chinese Physics C> 2014, Vol. 38> Issue(7) : 077005 DOI: 10.1088/1674-1137/38/7/077005

Experimental study using Touschek lifetime as machine status flag in SSRF

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Abstract：
The stabilities of the beam and machine have almost the highest priority in a modern light source. Although a lot of machine parameters could be used to represent the beam quality, there is no single parameter that could indicate the global information for the machine operators and accelerator physicists. For the last few years, a new parameter has been studied as a beam quality flag in the Shanghai Synchrotron Radiation Facility (SSRF). Calculations, simulations and detailed analysis of the real-time data from the storage ring have been made and the interesting results have confirmed its feasibility.

References

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CHEN Zhi-Chu, LENG Yong-Bin, YUAN Ren-Xian, YAN Ying-Bing and YU Lu-Yang. Experimental study using Touschek lifetime as machine status flag in SSRF[J]. Chinese Physics C, 2014, 38(7): 077005. doi: 10.1088/1674-1137/38/7/077005

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Received: 2013-09-10
Revised: 2013-12-05

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沈阳化工大学材料科学与工程学院沈阳 110142

Experimental study using Touschek lifetime as machine status flag in SSRF

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Experimental study using Touschek lifetime as machine status flag in SSRF

Corresponding author: CHEN Zhi-Chu,

Corresponding author: LENG Yong-Bin,

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