Theoretical analysis of BLM system for HLS Ⅱ

CHEN Yu-Kai; LI Yu-Xiong; LI Wei-Min; HE Li-Juan

doi:10.1088/1674-1137/39/1/017003

Chinese Physics C> 2015, Vol. 39> Issue(1) : 017003 DOI: 10.1088/1674-1137/39/1/017003

Theoretical analysis of BLM system for HLS Ⅱ

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Abstract：
Hefei Light Source (HLS) is being upgraded to HLS Ⅱ. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring (BLM) system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS Ⅱ. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS Ⅱ is proposed.

References

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CHEN Yu-Kai, LI Yu-Xiong, LI Wei-Min and HE Li-Juan. Theoretical analysis of BLM system for HLS Ⅱ[J]. Chinese Physics C, 2015, 39(1): 017003. doi: 10.1088/1674-1137/39/1/017003

CHEN Yu-Kai, LI Yu-Xiong, LI Wei-Min and HE Li-Juan. Theoretical analysis of BLM system for HLS Ⅱ[J]. Chinese Physics C, 2015, 39(1): 017003. doi: 10.1088/1674-1137/39/1/017003 shu

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Received: 2014-01-22
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Theoretical analysis of BLM system for HLS Ⅱ

Corresponding author: CHEN Yu-Kai,

Corresponding author: LI Yu-Xiong,

Received Date: 2014-01-22

Accepted Date: 1900-01-01

Available Online: 2015-01-05

Abstract: Hefei Light Source (HLS) is being upgraded to HLS Ⅱ. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring (BLM) system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS Ⅱ. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS Ⅱ is proposed.

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Theoretical analysis of BLM system for HLS Ⅱ

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通讯作者: 陈斌, bchen63@163.com

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