High Precision Standard Testing System for DCCT

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CHEN Bin, CHEN Su-Ying, CHENG Jian and ZHANG Jing. High Precision Standard Testing System for DCCT[J]. Chinese Physics C, 2008, 32(S1): 43-45.
CHEN Bin, CHEN Su-Ying, CHENG Jian and ZHANG Jing. High Precision Standard Testing System for DCCT[J]. Chinese Physics C, 2008, 32(S1): 43-45. shu
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Received: 2008-01-10
Revised: 1900-01-01
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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High Precision Standard Testing System for DCCT

    Corresponding author: CHEN Bin,

Abstract: In the BEPCⅡ, a great deal of DCCTs, with current output, are used as the measuring and feed-back units in power supplies. High Precision Standard Testing System for DCCT is designed and developed in order to detect and adjust the capability of DCCT. This testing system mainly consists of a PC computer, a 7.5 Digit Multimeter, a high precision DC current measuring system, and a high precision and stability power supply. The function and the structure of the testing system are simply analysed, and the test data are presented.

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