Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length

SUN Da-Rui; XU Jin-Qiang; TANG Kun

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《中国物理C》（英文）编辑部

2024年10月30日

Chinese Physics C> 2008, Vol. 32> Issue(S1) : 121-123

Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length

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Abstract：
For the development of high energy physics, it is needed to improve the performance of the relativistic electron bunch. The measurement of the ultrashort relativistic electron pulse becomes one of the key technologies. The electro-optic sampling measurement of relativistic electron pulses is a promising method. This method is nondestructive, non-intrusive, and real-time monitoring. Distance and angles of the reference frames will cause system deviations. In this paper these system deviations are analyzed by simulation. It provides a reference for the experiment.

References

[1]

. YAN X, MacLeod A M, Gillespie W A et al. Phys. Rev. Lett., 2000, 85(16) : 3404-34072. Berden G, Knippels G M H, Oepts D et al. Proc. DIPAC., 2003, IT05: 20-243. Wilke I, MacLeod A M, Gillespie W A et al. Phys. Rev. Lett., 2002, 88(12): 124801-1-124801-44. Berden G, Redlich B, van der Meer A F G. Proc. FEL. 2004, 343-3465. Yariv A. Optical Electronics in Modern Communications. Oxford University Press, 1997. 17-386. SUN Da-Rui et al. Measurement of Relativistic Electron Beam Bunch Bength by Electro-Optic Sampling Method. HPL PB, to be published(in Chinese)(孙大睿等. 用电光采样法测量相对论电子束团长度. 强激光与粒子束, 待发表)

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SUN Da-Rui, XU Jin-Qiang and TANG Kun. Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length[J]. Chinese Physics C, 2008, 32(S1): 121-123.

SUN Da-Rui, XU Jin-Qiang and TANG Kun. Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length[J]. Chinese Physics C, 2008, 32(S1): 121-123. shu

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Received: 2008-01-10
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length

Corresponding author: SUN Da-Rui,

Received Date: 2008-01-10
Accepted Date: 1900-01-01
Available Online: 2008-01-04

Abstract: For the development of high energy physics, it is needed to improve the performance of the relativistic electron bunch. The measurement of the ultrashort relativistic electron pulse becomes one of the key technologies. The electro-optic sampling measurement of relativistic electron pulses is a promising method. This method is nondestructive, non-intrusive, and real-time monitoring. Distance and angles of the reference frames will cause system deviations. In this paper these system deviations are analyzed by simulation. It provides a reference for the experiment.