Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

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SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230. doi: 10.1088/1674-1137/34/2/014
SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230.  doi: 10.1088/1674-1137/34/2/014 shu
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Received: 2009-06-24
Revised: 2009-07-14
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

    Corresponding author: SUN Da-Rui,

Abstract: 

The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6±1.2 ps.

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