Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

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LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202. doi: 10.1088/1674-1137/37/1/018202
LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202.  doi: 10.1088/1674-1137/37/1/018202 shu
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Received: 2012-03-02
Revised: 2012-08-16
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Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

    Corresponding author: TUO Xian-Guo,

Abstract: A semi-empirical detector response function (DRF) model of Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements' characteristic X-ray spectra are obtained by Si (PIN) detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.

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