Analog front-end prototype electronics for the LHAASO WCDA

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Cong Ma, Lei Zhao, Yu-Xiang Guo, Jian-Feng Liu, Shu-Bin Liu and Qi An. Analog front-end prototype electronics for the LHAASO WCDA[J]. Chinese Physics C, 2016, 40(1): 016101. doi: 10.1088/1674-1137/40/1/016101
Cong Ma, Lei Zhao, Yu-Xiang Guo, Jian-Feng Liu, Shu-Bin Liu and Qi An. Analog front-end prototype electronics for the LHAASO WCDA[J]. Chinese Physics C, 2016, 40(1): 016101.  doi: 10.1088/1674-1137/40/1/016101 shu
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Received: 2015-04-24
Revised: 2015-09-01
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    Supported by Knowledge Innovation Program of the Chinese Academy of Sciences (KJCX2-YW-N27), National Natural Science Foundation of China (11175174) and CAS Center for Excellence in Particle Physics (CCEPP)

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Analog front-end prototype electronics for the LHAASO WCDA

    Corresponding author: Lei Zhao,
  • 1. State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China
  • 2. Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China
Fund Project:  Supported by Knowledge Innovation Program of the Chinese Academy of Sciences (KJCX2-YW-N27), National Natural Science Foundation of China (11175174) and CAS Center for Excellence in Particle Physics (CCEPP)

Abstract: In the readout electronics of the Water Cerenkov Detector Array (WCDA) in the Large High Altitude Air Shower Observatory (LHAASO) experiment, both high-resolution charge and time measurement are required over a dynamic range from 1 photoelectron (P.E.) to 4000 P.E. The Analog Front-end (AFE) circuit is one of the crucial parts in the readout electronics. We designed and optimized a prototype of the AFE through parameter calculation and circuit simulation, and conducted initial electronics tests on this prototype to evaluate its performance. Test results indicate that the charge resolution is better than 1%@4000 P.E. and remains better than 10%@1 P.E., and the time resolution is better than 0.5 ns RMS, which is better than the application requirements.

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