Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

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LI Shu-Wei, KANG Ke-Jun, WANG Yi, LI Jin, LI Yuan-Jing and ZHANG Qing-Jun. Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background[J]. Chinese Physics C, 2010, 34(12): 1895-1899.
LI Shu-Wei, KANG Ke-Jun, WANG Yi, LI Jin, LI Yuan-Jing and ZHANG Qing-Jun. Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background[J]. Chinese Physics C, 2010, 34(12): 1895-1899. shu
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Received: 2010-01-19
Revised: 2010-04-27
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Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

    Corresponding author: LI Shu-Wei,

Abstract: 

The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.

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