Energy Dispersive X-Ray Diffraction Investigation of Beryllium Oxide under High Pressure

LUO Cong-Ju; LIU Jing; XU Ji-An; XIAO Wan-Sheng; LI Hui; LI Xiao-Dong

Chinese Physics C> 2005, Vol. 29> Issue(S1) : 106-108

Energy Dispersive X-Ray Diffraction Investigation of Beryllium Oxide under High Pressure

High Energy Institute of Physics Chinese Academy of Sciences,Beijing 100049,China2 Geophysical Laboratory Carnegie Institution of Washington 5251,Washington,DC 20015-1305,USA3 GuangZhou institute of Geochemistry,Chinese Academy of Sciences,Guangzhou 510640,China

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Abstract：
High pressure Energy dispersive X-ray diffraction of BeO has been studied in Beijing Synchrotron Radiation Facility (BSRF) . BeO remain hexagonal Wurtzite structure as ambient pressure phase when pressure from ambient pressure up to 42GPa, no phase transition occur, the cell volume decrease as pressure increase. The data of the Wurtzite phase ranging from 0.6 to 42GPa were fitted to the Murnaghan P-V equation of state. Assume K₀' to be 4 and obtained bulk modulus K₀=276GPa.

References

[1]

. Morell G, Pérez W, Ching-Prado E et al. Phys. Rev., 1996,B53: 53882. Slack G A, Austerman S B. J. Appl. Phys., 1971, 42: 47133. Hazen R M, Finger L W. J. Appl. Phys., 1986, 59: 37284. Hazen M, Finger L W. J. Appl. Phys., 1986, 59: 37285. Jephcoat A P et al. Phys. Rev., 1988, B37: 47276. Alessandra Continenza, Wentzcovitch R M, Freeman A J.Phys. Rev., 1990, B41: 35407. Boettger J C, Wills J M. Phys. Rev., 1996, B54: 89658. Narayana C, Nesamony V J, Ruoff A L. Phys. Rev., 1997,B56: 143389. Chan-Jeong Park, Sun-Ghil Lee, Young-Jo Ko et al. Phys.Rev., 1999, B59: 1350110. Yishihisa Mori, Tomoyuki Ikai, Kenichi Takarabe, PhotonFactory Activity Report 2002 #20 PartB, 2003, 21511. Peter J. Eng, Mattthew N. Dynamically Figured Kirkpa-trik Baez X-Ray Micro-Focusing Optics, SPIE Proc., 1998,145: 344912. LI X, LIU J, YANG S. Collimation of X-Ray Diffractionunder High Pressure at Beijing Synchrotron Radiation Fa-cility, J. Phys.: Condens. Matter, 2002, 14: 1054113. XU Yong-Nian, CHINGWY. Phys. Rev., 1993, B48: 4335

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LUO Cong-Ju, LIU Jing, XU Ji-An, XIAO Wan-Sheng, LI Hui and LI Xiao-Dong. Energy Dispersive X-Ray Diffraction Investigation of Beryllium Oxide under High Pressure[J]. Chinese Physics C, 2005, 29(S1): 106-108.

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Received: 2005-10-31
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Energy Dispersive X-Ray Diffraction Investigation of Beryllium Oxide under High Pressure

Corresponding author: LIU Jing,

High Energy Institute of Physics Chinese Academy of Sciences,Beijing 100049,China2 Geophysical Laboratory Carnegie Institution of Washington 5251,Washington,DC 20015-1305,USA3 GuangZhou institute of Geochemistry,Chinese Academy of Sciences,Guangzhou 510640,China

Received Date: 2005-10-31

Accepted Date: 1900-01-01

Available Online: 2005-01-02

Abstract: High pressure Energy dispersive X-ray diffraction of BeO has been studied in Beijing Synchrotron Radiation Facility (BSRF) . BeO remain hexagonal Wurtzite structure as ambient pressure phase when pressure from ambient pressure up to 42GPa, no phase transition occur, the cell volume decrease as pressure increase. The data of the Wurtzite phase ranging from 0.6 to 42GPa were fitted to the Murnaghan P-V equation of state. Assume K₀' to be 4 and obtained bulk modulus K₀=276GPa.

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Energy Dispersive X-Ray Diffraction Investigation of Beryllium Oxide under High Pressure

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