Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS

HU Zhao-Hui; LIU Ping-Sheng; FENG Guo-Hua; HUANG Yu-Ying

Chinese Physics C> 2003, Vol. 27> Issue(3) : 273-276

Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS

Institute of High Energy Physics, CAS, Beijing 100039, China

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Abstract：
The paper presents the study of feasibility on the trace element analysis with high-energy resolution by PSS at synchrotron radiation as an exciting source. Results are that the absolute value of ～10^－10g has been measured for elements of Ti and Cu in thin sample, the detection limit is about 1—10ppm order of magnitude for Cr in the substance of light base, and a well-proportional relation exists between the counts of net integrated area and the concentration of Cr in the samples of homogenized solution. These show that the PSS is feasible as a useful tool to analyze element with high-energy resolution.

References

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HU Zhao-Hui, LIU Ping-Sheng, FENG Guo-Hua and HUANG Yu-Ying. Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS[J]. Chinese Physics C, 2003, 27(3): 273-276.

HU Zhao-Hui, LIU Ping-Sheng, FENG Guo-Hua and HUANG Yu-Ying. Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS[J]. Chinese Physics C, 2003, 27(3): 273-276. shu

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Received: 2002-05-24
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS

Corresponding author: HU Zhao-Hui,

Institute of High Energy Physics, CAS, Beijing 100039, China

Received Date: 2002-05-24

Accepted Date: 1900-01-01

Available Online: 2003-03-05

Abstract: The paper presents the study of feasibility on the trace element analysis with high-energy resolution by PSS at synchrotron radiation as an exciting source. Results are that the absolute value of ～10^－10g has been measured for elements of Ti and Cu in thin sample, the detection limit is about 1—10ppm order of magnitude for Cr in the substance of light base, and a well-proportional relation exists between the counts of net integrated area and the concentration of Cr in the samples of homogenized solution. These show that the PSS is feasible as a useful tool to analyze element with high-energy resolution.

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