Aging Test of Multi-gap Resistive Plate Chambers

WANG Yi; KANG Ke-Jun; CHENG Jian-Ping; LI Yuan-Jing; LI Yang; LAI Yong-Fang; YUE Qian; LI Jin

Chinese Physics C> 2006, Vol. 30> Issue(5) : 441-444

Aging Test of Multi-gap Resistive Plate Chambers

Department of Engineering Physics, Tsinghua University, Beijing 100084, China

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Abstract：
We present the results of an aging test on two six-gap multi-gap resistive plate chambers (MRPC) designed for the RHIC-STAR TOF system. The test was carried out with a 100mCi ⁶⁰Co γ ray source. MRPCs were irradiated by different dose rates of the source. One module has been irradiated by high dose rate (2.87×10^－2Gy/h)for 24h. Great degradation of noise rate, dark current and other main specifications can be seen. Another module has been irradiated for 530h by relative lower dose rate of 5.31×10^－4Gy/h and no any significant performance degradation is observed. The goal of the test is to study the performance varaition of the detector by the large irradiation dose expected in the experiment in several years of operation.

References

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WANG Yi, KANG Ke-Jun, CHENG Jian-Ping, LI Yuan-Jing, LI Yang, LAI Yong-Fang, YUE Qian and LI Jin. Aging Test of Multi-gap Resistive Plate Chambers[J]. Chinese Physics C, 2006, 30(5): 441-444.

WANG Yi, KANG Ke-Jun, CHENG Jian-Ping, LI Yuan-Jing, LI Yang, LAI Yong-Fang, YUE Qian and LI Jin. Aging Test of Multi-gap Resistive Plate Chambers[J]. Chinese Physics C, 2006, 30(5): 441-444. shu

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Received: 2005-10-20
Revised: 2005-12-02

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Aging Test of Multi-gap Resistive Plate Chambers

Corresponding author: WANG Yi,

Department of Engineering Physics, Tsinghua University, Beijing 100084, China

Received Date: 2005-10-20

Accepted Date: 2005-12-02

Available Online: 2006-05-05

Abstract: We present the results of an aging test on two six-gap multi-gap resistive plate chambers (MRPC) designed for the RHIC-STAR TOF system. The test was carried out with a 100mCi ⁶⁰Co γ ray source. MRPCs were irradiated by different dose rates of the source. One module has been irradiated by high dose rate (2.87×10^－2Gy/h)for 24h. Great degradation of noise rate, dark current and other main specifications can be seen. Another module has been irradiated for 530h by relative lower dose rate of 5.31×10^－4Gy/h and no any significant performance degradation is observed. The goal of the test is to study the performance varaition of the detector by the large irradiation dose expected in the experiment in several years of operation.

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Aging Test of Multi-gap Resistive Plate Chambers

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