A new technique to measure the differential XAFS spectrum

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Min Wu, Li-Rong Zheng, Sheng-Qi Chu, Ai-Yu Zhou, Jing Zhang and Tian-Dou Hu. A new technique to measure the differential XAFS spectrum[J]. Chinese Physics C, 2016, 40(4): 048001. doi: 10.1088/1674-1137/40/4/048001
Min Wu, Li-Rong Zheng, Sheng-Qi Chu, Ai-Yu Zhou, Jing Zhang and Tian-Dou Hu. A new technique to measure the differential XAFS spectrum[J]. Chinese Physics C, 2016, 40(4): 048001.  doi: 10.1088/1674-1137/40/4/048001 shu
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Received: 2015-09-10
Revised: 2015-12-14
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    Supported by NSFC(11175202)

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A new technique to measure the differential XAFS spectrum

    Corresponding author: Tian-Dou Hu,
  • 1. Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 2. Institute of Materials, Chinese Academy of Engineering Physics, P. O. Box 9071, Jiangyou 621907, China
  • 3.  Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
Fund Project:  Supported by NSFC(11175202)

Abstract: A new technique has been developed for direct measurement of the differential X-ray absorption fine structure(XAFS) spectrum by the energy-modulation method. To acquire the energy-oscillating incident X-ray beam, a piezoelectric actuator is used to control the double-crystal monochromator. A logarithmic converter circuit and a lock-in amplifier are used to extract the modulated signals. The normal and differential XAFS spectra of the Mn K-edge of Li2MnO3 have been collected. The X-ray-absorption near-edge-structure(XANES) spectra verify that the signal-to-noise ratio has been greatly improved by the new technique, and the extended X-ray absorption fine structure(EXAFS) spectra demonstrate that this new technique can efficiently enhance the signals of the backscattering atoms.

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